Amplitude contrast image enhancement in digital holography for particles analysis by Singh, Vijay Raj, Asundi, Anand Krishna

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Instrument transfer function for digital holography system by Asundi, Anand Krishna, Yu, Yingjie, Sun, Tao

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Electrically tunable window based on microwrinkled ZnO/Ag thin film by Shrestha, Milan, Asundi, Anand, Lau, Gih-Keong

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Compact digital holoscope with dual wavelength by Di, Jianglei, Zhao, Jianlin, Asundi, Anand Krishna

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Camera calibration with active phase target : improvement on feature detection and optimization by Huang, Lei, Zhang, Qican, Asundi, Anand Krishna

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Quantitative phase from defocused intensity by image deconvolution by Zuo, Chao, Chen, Qian, Asundi, Anand Krishna

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Fast full-field out-of-plane deformation measurement using fringe reflectometry by Huang, Lei, Ng, Chi Seng, Asundi, Anand Krishna

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Effect of the location and size of a single crack on first fundamental frequency of a cantilever beam using fiber optic polarimetric sensors and characterisation of FBG sensors by Maheshwari, Muneesh, Asundi, Anand Krishna, Tjin, Swee Chuan

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Digital holographic microscopy for MEMS/MOEMS device inspection and complete characterization by Singh, Vijay Raj, Asundi, Anand, Hegde, G. M.

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4f amplified in-line compressive holography by Wu, Xiaoyan, Yu, Yingjie, Zhou, Wenjing, Asundi, Anand

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Practical considerations for high speed real-time 3D measurements by the fringe projection by Feng, Shijie, Chen, Qian, Zuo, Chao, Asundi, Anand

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Measurement of thermal effects of diode-pumped solid-state laser by using digital holography by Yu, Yang, Di, Jianglei, Qu, Weijuan, Asundi, Anand

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Review of phase measuring deflectometry by Huang, Lei, Idir, Mourad, Zuo, Chao, Asundi, Anand

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Phase discrepancy analysis and compensation for fast Fourier transform based solution of the transport of intensity equation by Zuo, Chao, Chen, Qian, Huang, Lei, Asundi, Anand

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Optical alignment of a cylindrical object by Song, Chaolong, Nguyen, Nam-Trung, Asundi, Anand Krishna

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Simultaneous measurement and reconstruction tailoring for quantitative phase imaging by Zhang, Zhengyun, Li, Wei-Na, Asundi, Anand, Barbastathis, George

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Noninterferometric single-shot quantitative phase microscopy by Zuo, Chao, Chen, Qian, Qu, Weijuan, Asundi, Anand Krishna

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Controlled micro-wrinkling of ultrathin indium-tin-oxide films for transparency tuning by Wei, Deyuan, Shrestha, Milan, Asundi, Anand, Lau, Gih-Keong

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Simultaneous measurement and reconstruction tailoring for quantitative phase imaging by Zhang, Zhengyun, Li, Wei-Na, Asundi, Anand, Barbastathis, George

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Digital in-line holography for dynamic micro-metrology by Hegde, Gopalkrishna M., Singh, Vijay Raj, Asundi, Anand Krishna

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