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Free Form Deformation-Based Image Registration Improves Accuracy of Traction Force Microscopy. by Alvaro Jorge-Peñas, Alicia Izquierdo-Alvarez, Rocio Aguilar-Cuenca, Miguel Vicente-Manzanares, José Manuel Garcia-Aznar, Hans Van Oosterwyck, Elena M de-Juan-Pardo, Carlos Ortiz-de-Solorzano, Arrate Muñoz-Barrutia
Published 2015-01-01
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