In situ thermal runaway of Si-based press-fit diodes monitored by infrared thermography by A. Moure, S. Román-Sánchez, A. Serrano, I. Lorite, J.F. Fernández

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Thermal response of active Si in press-fit rectifier diodes by confocal Raman microscopy: Influence of diode design and technology by S. Román-Sánchez, A. Serrano, A. del Campo, I. Lorite, J.F. Fernández, A. Moure

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Improving the reliability of silicon diodes via manufacturing process modification strategies by S. Román-Sánchez, M. París Ogáyar, I. Lorite, J.F. Fernández, A. Serrano, A. Moure

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Stress dynamics during O-T phase transitions in lead-free KNN-based piezoelectric ceramics by A. Moure, P. Val-Gómez, A. del Campo, J.F. Fernández, F. Rubio-Marcos

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I. Ediciones y técnica filológica – II. Lingüística – III. Literatura, filosofía y religión – IV. Historia y sociedad – V. Reseñas breves by J. R. Busto Saiz, Carmen Castillo, J. Campos, Ana M.ª Moure Casas, Marcelo Martínez Pastor, G. Morocho, María José López de Ayala, A. Bernabé, J. López Facal, F. Villar, M. Mayer, V. Bejarano, A. Tovar, O. García de la Fuente, J. Luque Moreno, S. Mariner, A. Martínez Díaz, José Alsina, Andrés Pociña, Miguel Ángel Elvira, Isabel Rodá, L. C. Pérez Castro

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