Impedance spectroscopy analysis of Al/100-plane AlN/p-Si MIS prepared by HiPIMS method for tailoring dielectric properties by Azman, Zulkifli, Nayan, Nafarizal, Megat Hasnan, Megat Muhammad Ikhsan, Abu Bakar, Ahmad Shuhaimi, Mamat, Mohamad Hafiz, Mohd. Yusop, Mohd. Zamri

Optical band gap and surface morphology of AlN thin-film sputtered by HiPIMS on glass substrate by Azman, Zulkifli, Nayan, Nafarizal, Othman, Nur Afiqah, Abu Bakar, Ahmad Shuhaimi, Mamat, Mohamad Hafiz, Mohd. Yusop, Mohd. Zamri, Ahmad, Muhammad Yazid

Effects of argon/nitrogen sputtering gas on the microstructural, crystallographic and piezoelectric properties of AlN thin films by Abd Samad, Muhammad Izzuddin, Mohd Noor, Mimiwaty, Nayan, Nafarizal, Abu Bakar, Ahmad Shuhaimi, Mansor, Marwan, Mahmood Zuhdi, Ahmad Wafi, Hamzah, Azrul Azlan, Latif, Rhonira

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Effects of radio-frequency power on structural properties and morphology of AlGaN thin film prepared by co-sputtering technique by Othman, Nur Afiqah, Nayan, Nafarizal, Mustafa, Mohd. Kamarulzaki, Azman, Zulkifli, Megat Hasnan, Megat Muhammad Ikhsan, Jaafar, Siti Noryasmin, Bakri, Anis Suhaili, Mamat, Mohd. Hafiz, Mohd. Yusop, Mohd. Zamri, Abu Bakar, Ahmad Shuhaimi, Ahmad, Mohd. Yazid

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Structural and morphological properties of AlGaN thin films prepared by co-sputtering technique by Othman, Nur Afiqah, Nayan, Nafarizal, Mustafa, Mohd. Kamarulzaki, Azman, Zulkifli, Megat Hasnan, Megat Muhammad Ikhsan, Bakri, Anis Suhaili, Jaffar, Siti Noryasmin, Abu Bakar, Ahmad Shuhaimi, Mamat, Mohd. Hafiz, Mohd. Yusop, Mohd. Zamri, Ahmad, Mohd. Yazid