Regression-Based Models to Predict Rice Leaf Area Index Using Biennial Fixed Point Continuous Observations of Near Infrared Digital Images by Michio Shibayama, Toshihiro Sakamoto, Eiji Takada, Akihirov Inoue, Kazuhiro Morita, Takuya Yamaguchi, Wataru Takahashi, Akihiko Kimura

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