Exploiting extrinsic passivation on thin film dielectrics for high efficiency solar cells by Al-Dhahir, I

Enhancing dielectric-silicon interfaces through surface electric fields during firing by Bonilla, RS, Al-Dhahir, I, Niu, X, Altermatt, PP, Hamer, P

Charge fluctuations at the Si-SiO2 interface and its effect on surface recombination in solar cells by Bonilla , RS, Al-Dhahir, I, Mingzhe, Y, Hamer, P, Altermatt, PP

Probing the interface state densities near band edges from inductively coupled measurements of sheet resistance by Yu, M, Wright, M, McNab, S, Al-Dhahir, I, Altermatt, PP, Bonilla, RS

Extracting band-tail interface state densities from measurements and modelling of space charge layer resistance by Yu, M, McNab, S, Al-Dhahir, I, Patrick, CE, Altermatt, PP, Bonilla, RS

The influence of surface electric fields on the chemical passivation of Si-SiO2 interfaces after firing by Al-Dhahir, I, McNab, S, Yu, M, Shaw, E, Hamer, P, Bonilla Osorio, RS

Alternative dielectrics for hole selective passivating contacts and the influence of nanolayer built-in charge by Mcnab, S, Yu, M, Al-Dhahir, I, Khorani, E, Rahman, T, Boden, SA, Altermatt, PP, Wilshaw, PR, Bonilla, RS

Ion‐charged dielectric nanolayers for enhanced surface passivation in high efficiency photovoltaic devices by Al‐Dhahir, I, Niu, X, Yu, M, McNab, S, Lin, Y, Altermatt, PP, Patrick, CE, Bonilla, RS

Electrostatic tuning of ionic charge in SiO2 dielectric thin films by Al-Dhahir, I, Yu, M, McNab, S, Collett, K, Liu, J, Grovenor, C, Wilshaw, P, Bonilla Osorio, RS

Assessing the potential of inversion layer solar cells based on highly charged dielectric nanolayers by Yu, M, Shi, Y, Deru, J, Al-Dhahir, I, McNab, S, Chen, D, Voss, M, Hwu, E-T, Ciesla, A, Hallam, B, Hamer, P, Altermatt, PP, Wilshaw, P, Bonilla, RS