Possibilities and limitations of focused laser technique application for SEE sensitivity parameters estimation by Alexander I. Chumakov

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Single event effects qualificatoin of integrated circuits by Armen V. Sogoyan, Anatoly A. Smolin, Alexander I. Chumakov

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Evaluating CMOS chip sensitivity parameters to single event upsets under influence of neutrons by the burst generation rate function by Dmitry O. Titovets, Nikolay D. Kravchenko, Andrey B. Karakozov, Alexander I. Chumakov, Dmitry V. Bobrovsky

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Some aspects of IC radiation hardness evaluation when exposed to neutrons by Alexander I. Chumakov, Armen V. Sogoyan, Dmitry V. Bobrovsky, Dmitry O. Titovets, Konstantin A. Chumakov, Sergey Y. Diankov, Vitaly V. Khaustov, Oleg A. Gerasimchuk, Dmitry I. Yurkov

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Hardness assurance levels and requirements for single event effects testing of integrated circuits by Alexander I. Chumakov, Armen V. Sogoyan, Anatoly A. Smolin, Alexey O. Ahmetov, Dmitry V. Bobrovsky, Dmitry V. Boychenko, Nikolai V. Ryasnoy, Konstantin A. Chumakov, Evgeny V. Churilin, Vladimir F. Gerasimov, Vitaly V. Khaustov, Alexander A. Sashov, Anastasia V. Ulanova, Andrey V. Yanenko

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