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    Temperature dependence of exchange bias in (NiFe/IrMn)n multilayer films studied through static and dynamic techniques

    Temperature dependence of exchange bias in (NiFe/IrMn)n multilayer films studied through static and dynamic techniques by Daniel J. Adams, Shankar Khanal, Mohammad Asif Khan, Artur Maksymov, Leonard Spinu

    Published 2018-05-01
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