Showing 1 - 9 results of 9 for search 'Ashoori, Raymond C', query time: 0.03s
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Subsurface Charge Accumulation Imaging by Ashoori, Raymond C., Tessmer, Stuart, Glicofridis, Paul I.
Published 2010
Technical Report -
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Single-Electron Spectroscopy by Ashoori, Raymond C., Berman, David B., Brodsky, Mikhail G., Chan, Ho-Bun, Heemeyer, Sven
Published 2010
Technical Report -
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Single-Electron Spectroscopy by Ashoori, Raymond C., Chan, Ho-Bun, Berman, David B., Brodsky, Mikhail G., Heemeyer, Sven, Folch, Albert
Published 2010
Technical Report -
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Single-Electron Spectroscopy by Ashoori, Raymond C., Tessmer, Stuart, Berman, David B., Smith, Henry I., Chan, Ho-Bun, Zhitenev, Nikolai, Brodsky, Mikhail G.
Published 2010
Technical Report -
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Single-Electron Spectroscopy by Ashoori, Raymond C., Tessmer, Stuart, Cohen, Aaron S., Silevitch, Daniel M., LeBlanc, William M., Berman, David B., Smith, Henry I., Chan, Ho-Bun, Zhitenev, Nikolai, Brodsky, Mikhail G.
Published 2010
Technical Report -
7
Nanostructures, Technology, Research, and Applications by Smith, Henry I., Silverman, Scott E., Ferrera, Juan, Carter, James M., Lim, Michael H. Y., Moon, Euclid E., Wong, Vincent V., Yang, Isabel Y., Burkhardt, Martin, Franke, Andrea E., Mondol, Mark K., Murphy, Edward, Everett, Patrick N., Fleming, Robert C., Jr., Savas, Timothy A., Schattenburg, Mark L., Shah, Satyen N., Thompson, Carl V., Yasaka, Anto, Jackson, Keith M., Antoniadis, Dimitri A., Meinhold, Mitchell W., Carter, David J., Sokolinski, Ilia, Melloch, Michael R., Orlando, Terry P., Pepin, Anne, Schweizer, Mark R., Berman, David B., Ashoori, Raymond C., Marley, Elisabeth A., Murphy, Thomas E., Kolodziejski, Leslie A., Damask, Jay N., Haus, Hermann A., Aucoin, Richard J., Canizares, Claude R., Porter, Jeanne M.
Published 2010
Technical Report -
8
Nanostructures, Technology, Research, and Applications by Smith, Henry I., Goodberlet, James G., Ferrera, Juan, Mondol, Mark K., Carter, David J., Carter, James M., Daley, James M., Lim, Michael H. Y., Moon, Euclid E., Schweizer, Mark R., Mao, Wendy, Murphy, Edward R., Yang, Isabel Y., Yuan, Jing, Everett, Patrick N., Farhoud, Maya S., Fleming, Robert C., Jr., Savas, Timothy A., Schattenburg, Mark L., Jackson, Keith M., Antoniadis, Dimitri A., Lochtefeld, Anthony, Chandrakasan, Anantha P., Meinhold, Mitchell W., Sokolinski, Ilia, Melloch, Michael R., Orlando, Terry P., Pepin, Anne, Berman, David B., Ashoori, Raymond C., Foresi, James S., Villeneuve, Pierre R., Joannopoulos, John D., Kimerling, Lionel C., Damask, Jay N., Murphy, Thomas E., Haus, Hermann A., Kolodziejski, Leslie A., Porter, Jeanne M., Prentiss, Jane D., Sisson, Robert D., van Beek, Joost, Canizares, Claude R., Franke, Andrea E.
Published 2010
Technical Report -
9
Nanostructures Technology, Research, and Applications by Smith, Henry I., Mondol, Mark K., Goodberlet, James G., Bernshteyn, Alex, Ferrera, Juan, Carter, David J., Schweizer, Mark R., Daley, James M., Lim, Michael H. Y., Moon, Euclid E., Djohmehri, Ihsan, Savas, Timothy A., Carter, James M., Murphy, Edward R., Everett, Patrick N., Lee, Jawoong, Farhoud, Maya S., Fleming, Robert C., Jr., Schattenburg, Mark L., Ross, Caroline A., Youcef-Toumi, Kamal, Bae, Jungmok M., Hwang, M., Jackson, Keith M., Lee, Zachary K., Antoniadis, Dimitri A., Lochtefeld, Anthony, Sokolinski, Ilia, Chung, James E., Meinhold, Mitchell W., Berman, David B., Ashoori, Raymond C., Fan, Shanhui, Foresi, James S., Steinmeyer, Günter, Thoen, Erik R., Villeneuve, Pierre R., Ippen, Erich P., Joannopoulos, John D., Kimerling, Lionel C., Qi, Minghao, Damask, Jay N., Khan, Mohammed Jalal, Koontz, Elisabeth M., Murphy, Thomas E., Kolodziejski, Leslie A., Haus, Hermann A., van Beek, Joost, Hindle, P., Porter, Jeannie M., Prentiss, Jane D., Sisson, Robert D., Canizares, Claude R., Franke, Andrea E., Pflug, David, Akinwande, Akintunde I., Bozler, Carl, Rana, Farhan, Marley, Elisabeth A., Ram, Rajeev J.
Published 2010
Technical Report