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Nondestructive testing method for a new generation of electronics by Azin Anton, Zhukov Andrey, Narikovich Anton, Ponomarev Sergey, Rikkonen Sergey, Leitsin Vladimir
Published 2018-01-01
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Nondestructive testing method for a new generation of electronics by Azin Anton, Zhukov Andrey, Narikovich Anton, Ponomarev Sergey, Rikkonen Sergey, Leitsin Vladimir
Published 2018-01-01
Article