Parameter free AEWMA control chart for dispersion in semiconductor manufacturing by Abdullah A. Zaagan, Imad Khan, Ali Rashash R. Alzahrani, Bakhtiyar Ahmad

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Statistical analysis of seroprevalence and risk factors of hepatitis C in Nowshera District, Pakistan by Roohul Amin, Olayan Albalawi, Imad Khan, Rafi Ullah, Imed Boukhris, Bakhtiyar Ahmad

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Memory type Bayesian adaptive max-EWMA control chart for weibull processes by Abdullah A. Zaagan, Imad Khan, Amel Ayari-Akkari, Aamir Raza, Bakhtiyar Ahmad

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Monitoring of semiconductor manufacturing process on Bayesian AEWMA control chart under paired ranked set sampling schemes by Yuzhen Wang, Imad Khan, Muhammad Noor-ul-Amin, Salman A. AlQahtani, Bakhtiyar Ahmad

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Process dispersion monitoring: Innovative AEWMA control chart in semiconductor manufacturing by Imad Khan, Muhammad Noor-ul-Amin, Muhammad Usman Aslam, Almetwally M. Mostafa, Bakhtiyar Ahmad

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A novel flexible exponent power-X family of distributions with applications to COVID-19 mortality rate in Mexico and Canada by Zubir Shah, Dost Muhammad Khan, Imad Khan, Bakhtiyar Ahmad, Mouna Jeridi, Sanaa Al-Marzouki

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Risk adjusted EWMA control chart based on support vector machine with application to cardiac surgery data by Muhammad Noor-ul-Amin, Imad Khan, Ali Rashash R. Alzahrani, Amel Ayari-Akkari, Bakhtiyar Ahmad

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Improved nonparametric survival prediction using CoxPH, Random Survival Forest & DeepHit Neural Network by Naseem Asghar, Umair Khalil, Basheer Ahmad, Huda M. Alshanbari, Muhammad Hamraz, Bakhtiyar Ahmad, Dost Muhammad Khan

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Sequence based model using deep neural network and hybrid features for identification of 5-hydroxymethylcytosine modification by Salman Khan, Islam Uddin, Mukhtaj Khan, Nadeem Iqbal, Huda M. Alshanbari, Bakhtiyar Ahmad, Dost Muhammad Khan

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Effect of carbon nanotubes and zinc oxide on electrical and mechanical properties of polyvinyl alcohol matrix composite by electrospinning method by Shehryar Ali Shah, Hamza Ali, Muhammad Imran Inayat, Emad E. Mahmoud, Hakim AL Garalleh, Bakhtiyar Ahmad

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Max-mixed EWMA control chart for joint monitoring of mean and variance: an application to yogurt packing process by Seher Malik, Muhammad Hanif, Muhammad Noor-ul-Amin, Imad Khan, Bakhtiyar Ahmad, Abdelgalal O. I. Abaker, Jumanah Ahmed Darwish

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Bayesian AEWMA control chart under ranked set sampling with application to reliability engineering by Imad Khan, Muhammad Noor-ul-Amin, Dost Muhammad Khan, Umair Khalil, Emad A. A. Ismail, Uzma Yasmeen, Bakhtiyar Ahmad

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