ATNet: A Defect Detection Framework for X-ray Images of DIP Chip Lead Bonding by Renbin Huang, Daohua Zhan, Xiuding Yang, Bei Zhou, Linjun Tang, Nian Cai, Han Wang, Baojun Qiu

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A Lightweight Method for Detecting IC Wire Bonding Defects in X-ray Images by Daohua Zhan, Jian Lin, Xiuding Yang, Renbin Huang, Kunran Yi, Maoling Liu, Hehui Zheng, Jingang Xiong, Nian Cai, Han Wang, Baojun Qiu

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