THE EFFECT OF GEOMETRICAL AND MATERIAL PARAMETERS ON THE STRESS RELIEF OF MISMATCHED HETEROEPITAXIAL SYSTEMS by Beanland, R, Pond, R

Characterizing oxygen atoms in perovskite and pyrochlore oxides using ADF-STEM at a resolution of a few tens of picometers by Mostaed, A, Walkley, B, Hatnean, MC, Balakrishnan, G, Lees, MR, Beanland, R, Sinclair, DC, Reaney, IM

Activation of Al2O3 surface passivation of silicon: separating bulk and surface effects by Grant, NE, Pain, SL, Khorani, E, Jefferies, R, Wratten, A, McNab, S, Walker, D, Han, Y, Beanland, R, Bonilla, RS, Murphy, JD

Managing dose-, damage- and data-rates in multi-frame spectrum-imaging by Jones, L, Varambhia, A, Beanland, R, Kepaptsoglou, D, Griffiths, I, Ishizuka, A, Azough, F, Freer, R, Ishizuka, K, Cherns, D, Ramasse, Q, Lozano-Perez, S, Nellist, P