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Resistive RAM endurance : array-level characterization and correction techniques targeting deep learning applications מאת Grossi, Alessandro, Vianello, Elisa, Mohamed M. Sabry, Barlas, Marios, Grenouillet, Laurent, Coignus, Jean, Beigne, Edith, Wu, Tony, Le, Binh Q, Wootters, Mary K., Zambelli, Cristian, Nowak, Etienne, Mitra, Subhasish
יצא לאור 2020
Journal Article -
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14.3 A 43pJ/cycle non-volatile microcontroller with 4.7μs shutdown/wake-up integrating 2.3-bit/cell resistive RAM and resillence techniques מאת Wu, Tony F., Le, Binh Q., Radway, Robert, Bartolo, Andrew, Hwang, William, Jeong, Seungbin, Li, Haitong, Tandon, Pulkit, Vianello, Elisa, Vivet, Pascal, Nowak, Etienne, Wootters, Mary K., Wong, Philip H.-S., Mohamed M. Sabry Aly, Beigne, Edith, Mitra, Subhasish
יצא לאור 2020
Conference Paper