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White-light-induced annihilation of percolation paths in SIO2 and high-k dielectrics - prospect for gate oxide reliability rejuvenation and optical-enabled functions in CMOS integr... by Ang, Diing Shenp, Kawashima, Tomohito, Zhou, Yu, Yew, Kwang Sing, Bera, Milan Kumar, Zhang, Haizhong
Published 2018
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Restoration of postbreakdown gate oxide by white-light illumination by Kawashima, Tomohito, Yew, Kwang Sing, Zhou, Yu, Ang, Diing Shenp, Bera, Milan Kumar, Zhang, Haizhong
Published 2018
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