Showing 1 - 1 results of 1 for search 'Billal Allouche', query time: 0.02s Refine Results
  1. 1
    Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors

    Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors by Soo Cheol Kang, So Young Kim, Sang Kyung Lee, Kiyung Kim, Billal Allouche, Hyeon Jun Hwang, Byoung Hun Lee

    Published 2020-06-01
    Get full text
    Article

Search Tools: