Modelling of Kelvin probe surface voltage and photovoltage in dielectric-semiconductor interfaces by Bonilla Osorio, RS

A technique for field effect surface passivation for silicon solar cells by Bonilla Osorio, RS, Wilshaw, P

Selective laser melting of metal foils for ultrathin patterned contacts in silicon solar cells by Shi, Y, Bonilla Osorio, RS

Very low surface recombination velocity in n-type c-Si using extrinsic field effect passivation by Bonilla Osorio, RS, Woodcock, F, Wilshaw, PR

Thermal processes and their impact on surface‐related degradation by Hamer, P, Chen, D, Bonilla Osorio, RS

Historical market projections and the future of silicon solar cells by Stefani, BV, Kim, M, Zhang, Y, Bonilla Osorio, RS, Wright, M

NanoLBIC characterisation of silicon solar cells using a laser pick-up unit by Shi, Y, Yu, M, Goodarzi, M, Voss, M, Hwu, E-T, Bonilla Osorio, RS

Data for oxide-nitride nanolayer stacks for enhanced passivation of p-type surfaces in silicon solar cells by Bonilla Osorio, RS, Niu, X, Lozano-Perez, S, Soeriyadi, A, McNab, S, He, G

The influence of surface electric fields on the chemical passivation of Si-SiO2 interfaces after firing by Al-Dhahir, I, McNab, S, Yu, M, Shaw, E, Hamer, P, Bonilla Osorio, RS

Performance optimization of lead-free MASnBr3 based perovskite solar cells by SCAPS-1D device simulation by Mushtaq, S, Tahir, S, Ashfaq, A, Bonilla Osorio, RS, Haneef, M, Saeed, R, Ahmad, W, Amin, N

Electrostatic tuning of ionic charge in SiO2 dielectric thin films by Al-Dhahir, I, Yu, M, McNab, S, Collett, K, Liu, J, Grovenor, C, Wilshaw, P, Bonilla Osorio, RS

Characterization of solar cell passivating contacts using time-of-flight elastic recoil detection analysis by Shi, Y, Wright, M, Sharpe, MK, McAleese, CD, Polzin, J-I, Niu, X, Zhao, Z, Morris, S, Bonilla Osorio, RS

Electronic characteristics of ultra-thin passivation layers for silicon photovoltaics by Pain, SL, Khorani, E, Niewelt, T, Wratten, A, Fajardo, GJP, Winfield, BP, Bonilla Osorio, RS, Walker, M, Piper, LFJ, Grant, NE, Murphy, JD

Towards accurate atom scale characterisation of hydrogen passivation of interfaces in TOPCon architectures by Shi, Y, Jones, ME, Meier, MS, Wright, M, Polzin, J-A, Kwapil. W, Fischer, C, Schubert, MC, Grovenor, C, Moody, M, Bonilla, RS, Bonilla Osorio, RS