Semiconductor process design : representations, tools, and methodologies by Boning, Duane S

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2.854 / 2.853 Introduction to Manufacturing Systems, Fall 2010 by Gershwin, Stanley, Boning, Duane

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The limitations of adversarial training and the blind-spot attack by Chen, Hongge, Boning, Duane S

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Measurement and analysis of contact plug resistance variability by Boning, Duane S., Balakrishnan, Karthik

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Characterization and Modeling of Chemical-Mechanical Polishing for Polysilicon Microstructures by Tang, Brian D., Boning, Duane S.

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Towards nanoimprint lithography-aware layout design checking by Boning, Duane S., Taylor, Hayden Kingsley

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Mitigation of Thermal Stability Concerns in FinFET Devices by Bender, Emmanuel, Bernstein, Joseph B., Boning, Duane S.

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Modern Trends in Microelectronics Packaging Reliability Testing by Bender, Emmanuel, Bernstein, Joseph B., Boning, Duane S.

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A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers by Boo, Hyun Ho, Boning, Duane S., Lee, Hae-Seung

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Multi-strata subsurface laser die singulation to enable defect-free ultra-thin stacked memory dies by Teh, Weng Hong, Boning, Duane S, Welsch, Roy E

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Adjoint-based particle defect yield modeling for silicon photonics by Zhang, Zhengxing, McIlrath, Michael B, Boning, Duane S

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Adjoint-based particle defect yield modeling for silicon photonics by Zhang, Zhengxing, McIlrath, Michael B., Boning, Duane S

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Effects of a random process variation on the transfer characteristics of a fundamental photonic integrated circuit component by El-Henawy, Sally I., Miller, Ryan, Boning, Duane S.

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Yield Prediction for Coupled-Resonator Optical Waveguides Using Variation-Aware Compact Models by El-Henawy, Sally I., Lang, Christopher, Boning, Duane S.

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Lack of spatial correlation in mosfet threshold voltage variation and implications for voltage scaling by Boning, Duane S., Drego, Nigel A., Chandrakasan, Anantha P.

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All-Digital Circuits for Measurement of Spatial Variation in Digital Circuits by Drego, Nigel A., Chandrakasan, Anantha P., Boning, Duane S.

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A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration by Chang, Albert H., Lee, Hae-Seung, Boning, Duane S.

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Photonic device sensitivity analysis methods: towards process variation-aware silicon photonics design by Elhenawy, Sally I, Zhang, Zhengxing, Miller, Ryan, Boning, Duane S

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Robust decision trees against adversarial examples by Chen, Hongge, Xhange, Huan, Boning, Duane S, Hsieh, Cho-Jui

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Yield Prediction for Coupled-Resonator Optical Waveguides Using Variation-Aware Compact Models by El-Henawy, Sally I., Lang, Christopher I., Boning, Duane S

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