Showing 1 - 3 results of 3 for search 'Boo, Ann Ann', query time: 0.02s Refine Results
  1. 1
    PMOSFET NBTI (negative-bias temperature instability) measurement using ultra-fast switching method

    PMOSFET NBTI (negative-bias temperature instability) measurement using ultra-fast switching method by Boo, Ann Ann.

    Published 2009
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    Final Year Project (FYP)
  2. 2
    On the "switching defects" in the SiON and high-k gate dielectrics subjected to bias-temperature stressing

    On the "switching defects" in the SiON and high-k gate dielectrics subjected to bias-temperature stressing by Boo, Ann Ann

    Published 2015
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    Thesis
  3. 3
    New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

    New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing by Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp

    Published 2018
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    Journal Article

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