Characterization of 2DEG on WG semiconductors through sub-sampled 4DSTEM by Nicotra Giuseppe, Sfuncia Gianfranco, Robinson W Alex, Nicholls Daniel, Wells Jack, Mio M Antonio, Bongiorno Corrado, Bottari Cettina, Adamo Salvatore, Russo Alfio, Alessandrino Santi, Browning D Nigel, Spinella Corrado

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Hard X-ray transient grating spectroscopy on bismuth germanate by Rouxel, Jérémy R., Fainozzi, Danny, Mankowsky, Roman, Rösner, Benedikt, Seniutinas, Gediminas, Mincigrucci, Riccardo, Catalini, Sara, Foglia, Laura, Cucini, Riccardo, Döring, Florian, Kubec, Adam, Koch, Frieder, Bencivenga, Filippo, Haddad, Andre Al, Gessini, Alessandro, Maznev, Alexei A., Cirelli, Claudio, Gerber, Simon, Pedrini, Bill, Mancini, Giulia F., Razzoli, Elia, Burian, Max, Ueda, Hiroki, Pamfilidis, Georgios, Ferrari, Eugenio, Deng, Yunpei, Mozzanica, Aldo, Johnson, Philip J. M., Ozerov, Dmitry, Izzo, Maria Grazia, Bottari, Cettina, Arrell, Christopher, Divall, Edwin James, Zerdane, Serhane, Sander, Mathias, Knopp, Gregor, Beaud, Paul, Lemke, Henrik T., Milne, Chris J., David, Christian, Torre, Renato, Chergui, Majed, Nelson, Keith A., Masciovecchio, Claudio, Staub, Urs, Patthey, Luc, Svetina, Cristian

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