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Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy by Dipankar Sen, Alma Fernández, Daniel Crozier, Brian Henrich, Alexei V. Sokolov, Marlan O. Scully, William L. Rooney, Aart J. Verhoef
Published 2023-01-01
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