Characterization of 2DEG on WG semiconductors through sub-sampled 4DSTEM por Nicotra Giuseppe, Sfuncia Gianfranco, Robinson W Alex, Nicholls Daniel, Wells Jack, Mio M Antonio, Bongiorno Corrado, Bottari Cettina, Adamo Salvatore, Russo Alfio, Alessandrino Santi, Browning D Nigel, Spinella Corrado

Ligazón do recurso