Analysis and Design of Regular Structures for Robust Dynamic Fault Testability by Bryan, Michael J., Devadas, Srinivas, Keutzer, Kurt

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Custom Integrated Circuits by Allen, Jonathan, Wyatt, John L., Jr., Devadas, Srinivas, White, Jacob K., Armstrong, Robert C., Baltus, Donald G., Bamji, Cyrus S., McCormick, Steven P., Reichelt, Mark W., Van Aelten, Filip J., Horn, Berthold K. P., Lee, Hae-Seung, Poggio, Tomaso, Sodini, Charles G., Decker, Steven J., Elfadel, Ibrahim M., Hakkarainen, Mikko, Keast, Craig L., McQuirk, Ignacio S., Seidel, Mark N., Standley, David L., Umminger, Christopher B., Yang, Woodward, Bryan, Michael J., Chen, Curtis S., Lam, Kevin, Lumsdaine, Andrew, Silveira, Luis M., Lloyd, Jennifer A., Phillips, Joel R., Rahmat, Khalid, Antoniadis, Dimitri A., Nabors, Keith S., Telichevsky, Ricardo

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