Multi-scale order in amorphous transparent oxide thin films by Yan, A, Sun, T, Borisenko, K, Buchholz, D, Chang, R, Kirkland, A, Dravid, V

The D0 Silicon Microstrip Tracker by Ahmed, SN, Angstadt, R, Aoki, M, Asman, B, Austin, S, Bagby, L, Barberis, E, Baringer, P, Bean, A, Bischoff, A, Blekman, F, Bolton, T, Boswell, C, Bowden, M, Browning, F, Buchholz, D, Burdin, S, Butler, D, Cease, H, Choi, S, Clark, A, Clutter, J, Cooper, A, Cooper, W, Corcoran, M

The layer 0 inner silicon detector of the D0 experiment by Angstadt, R, Bagby, L, Bagby, L, Bean, A, Bean, A, Bolton, T, Bolton, T, Buchholz, D, Buchholz, D, Butler, D, Butler, D, Christofek, L, Christofek, L, Cooper, W, Cooper, W, Daly, C, Daly, C, Demarteau, M, Demarteau, M, Foglesong, J, Foglesong, J, Gerber, C, Gerber, C, Gonzalez, H, Gonzalez, H, Green, J, Green, J, Guldenman, H, Guldenman, H, Hanagaki, K, Hanagaki, K, Herner, K, Herner, K, Howell, J, Howell, J, Hrycyk, M, Hrycyk, M, Johnson, M, Johnson, M, Kirby, M, Kirby, M, Krempetz, K, Krempetz, K, Kuykendall, W, Kuykendall, W, Lehner, F, Lehner, F, Lipton, R, Lipton, R