Analysis of FeySe1-xTex thin films grown by radio frequency sputtering by Speller, S, Aksoy, C, Saydam, M, Taylor, H, Burnell, G, Boothroyd, A, Grovenor, C

Grain boundary properties of T1-2212 and T1-1223 thin films by Dark, C, Speller, S, Wu, H, Sundaresan, A, Tanaka, Y, Burnell, G, Grovenor, C

Grain boundary properties of Tl-2212 and Tl-1223 thin films by Dark, C, Speller, S, Wu, H, Sundaresan, A, Tanaka, Y, Burnell, G, Grovenor, C

Sub-micron thin film intrinsic Josephson junctions by Warburton, P, Kuzhakhmetov, A, Bell, C, Burnell, G, Blamire, MG, Wu, H, Grovenor, C, Schneidewind, H

Multiple-peak switching current distribution in Tl-Ba-Ca-Cu-O intrinsic Josephson junctions by Warburton, P, Kuzhakhmetov, A, Chana, O, Hyland, D, Grovenor, C, Burnell, G, Blamire, MG, Schneldewind, H

Alternating current Josephson effect in intrinsic Josephson bridges in Tl2Ba2CaCu2O8 thin films by Chana, O, Kuzhakhmetov, A, Warburton, P, Hyland, D, Dew-Hughes, D, Grovenor, C, Kinsey, R, Burnell, G, Booij, W, Blamire, MG, Kleiner, R, Muller, P

Josephson fluxon flow and phase diffusion in thin-film intrinsic Josephson junctions by Warburton, P, Kuzhakhmetov, A, Chana, O, Burnell, G, Blamire, MG, Schneidewind, H, Koval, Y, Franz, A, Muller, P, Hyland, D, Dew-Hughes, D, Wu, H, Grovenor, C