Expected resolution limits of x-ray free-electron laser single-particle imaging for realistic source and detector properties by Juncheng E, Y. Kim, J. Bielecki, M. Sikorski, R. de Wijn, C. Fortmann-Grote, J. Sztuk-Dambietz, J. C. P. Koliyadu, R. Letrun, H. J. Kirkwood, T. Sato, R. Bean, A. P. Mancuso, C. Kim

Get full text