Size Effects on Thermal Properties of Thin Metal Films With Rough Surfaces 由 C. R. Tellier

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A New Analytical Expression for the T.C.R. of Thin Monocrystalline Metal Films 由 C. R. Tellier

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Size and Grain-Boundary Effects in the Electrical Conductivity of Thin Monocrystalline Films 由 C. R. Tellier

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Thin Metal Film Sensors 由 C. R. Tellier

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Grain Size Dependence of the Gauge Factor of Thin Metallic Films 由 A. J. Tosser, C. R. Tellier

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Comments on Size Effects in Metallic Films 由 A. J. Tosser, C. R. Tellier

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Some Investigations on the Anisotropy of the Chemical Etching of (hk0) and (hhl) Silicon Plates in a NaOH 35% Solution. Part I: 2D Etching Shapes 由 C. A. Hodebourg, C. R. Tellier

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Adequate Use of the Cottey Model for the Description of Conduction in Polycrystalline Films 由 A. J. Tosser, C. R. Tellier

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The Electrical Resistivity of Monocrystalline Films Deduced From Derivation of the Mayadas-Shatzkes Equations 由 A. J. Tosser, C. R. Tellier

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Resistivity Recovery of Thin Sputtered Aluminium Films 由 C. R. Tellier, A. J. Tosser

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Some Investigations on the Anisotropy of the Chemical Etching of (h k 0) and (h h l) Silicon Plates in a NaOH 35% Solution. Part II: 3D Etching Shapes, Analysis and Comparison with... 由 C. R. Tellier, C. A. Hodebourg, S. Durand

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Anisotropic Chemical Etching of III—V Crystals Dissolution Slowness Surface and Application to GaAs 由 C. R. Tellier, G. Huve, T. G. Leblois

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Chemical Etching of {hk0} Silicon Plates in EDP Part I: Experiments and Comparison with TMAH 由 C. R. Tellier, T. G. Leblois, A. Charbonnieras

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Temperature Dependence of the Hall Coefficient of Thin Films 由 A. J. Tosser, C. Pichard, C. R. Tellier

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Hyperbolic Approximate Form of the Mayadas-Shatzkes Function 由 A. J. Tosser, C. R. Tellier, C. R. Pichard

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Physical Basis of Warkusz's Equation for Polycrystalline Metallic Conductivity 由 C. R. Tellier, A. J. Tosser, C. R. Pichard

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Size Effects in the Thermal Variations of the Hall Coefficient 由 A. J. Tosser, C. R. Tellier, C. R. Pichard

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Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains 由 C. R. Pichard, A. J. Tosser, C. R. Tellier

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Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient 由 C. R. Tellier, A. J. Tosser, C. R. Pichard

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