Molecular Layer Deposition (MLD) of a Blocked Mercapto Silane on Precipitated Silica von S. Kim, J. R. van Ommen, D. La Zara, N. Courtois, J. Davin, C. Recker, J. Schoeffel, A. Blume, A. Talma, W. K. Dierkes

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Confirming X-ray parametric down conversion by time–energy correlation von N.J. Hartley, D. Hodge, T. Buckway, R. Camacho, P. Chow, E. Christie, A. Gleason, S. Glenzer, A. Halavanau, A.M. Hardy, C. Recker, S. Sheehan, S. Shwartz, H. Tarvin, M. Ware, J. Wunschel, Y. Xiao, R.L. Sandberg, G. Walker

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