Showing 1 - 2 results of 2 for search 'CUI Jiangwei', query time: 0.02s Refine Results
  1. 1
    Damage law and mechanism of total dose of PDSOI transistors with different channel lengths caused by backgate bias

    Damage law and mechanism of total dose of PDSOI transistors with different channel lengths caused by backgate bias by WANG Haiyang, ZHENG Qiwen, CUI Jiangwei, LI Yudong, GUO Qi

    Published 2022-05-01
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    Article
  2. 2
    Static and Dynamic Radiation Damage of Silicon Carbide VDMOS and Their Comparison

    Static and Dynamic Radiation Damage of Silicon Carbide VDMOS and Their Comparison by FENG Haonan;YANG Sheng;LIANG Xiaowen;ZHANG Dan;PU Xiaojuan;SUN Jing;WEI Ying;CUI Jiangwei;LI Yudong;YU Xuefeng;GUO Qi

    Published 2022-04-01
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    Article

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