A critical-point yield model to appraise the damage caused to soybean by white-mold by Erlei M. Reis, Mateus Zanatta, Fernando Cezar Juliatti, Hercules D. Campos, Luis Henrique Carregal P. Silva, Maurício C. Meyer, José Nunes Junior, Cláudia B. Pimenta, Daniel Cassetari Neto, Andréia Q. Machado, Carlos M. Utiamada

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