Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays by Fernando Rodríguez Varela, Manuel José López Morales, Rubén Tena Sánchez, Alfonso Tomás Muriel Barrado, Elena de la Fuente González, Guillermo Posada Quijano, Carlos Zarzuelo Torres, Manuel Sierra Pérez, Manuel Sierra Castañer

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