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Author
Chang, Albert Hsu Ting
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Chang, Albert Hsu Ting
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1
A test structure for the measurement and characterization of layout-induced transistor variation
by
Chang, Albert Hsu Ting
Published 2010
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2
Low-power high-performance SAR ADC with redundancy and digital background calibration
by
Chang, Albert Hsu Ting
Published 2013
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