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  1. 1
    In Situ TEM of Electrochemical Incidents: Effects of Biasing and Electron Beam on Electrochemistry

    In Situ TEM of Electrochemical Incidents: Effects of Biasing and Electron Beam on Electrochemistry by Chaoya Han, Md Tariqul Islam, Chaoying Ni

    Published 2021-03-01
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    Article
  2. 2
    Gallium-incorporated TiO2 thin films by atomic layer deposition for future electronic devices

    Gallium-incorporated TiO2 thin films by atomic layer deposition for future electronic devices by Qingxuan Sun, Yingzhen Lin, Chaoya Han, Ze Yang, Ying Li, Yuping Zeng, Weifeng Yang, Jie Zhang

    Published 2024-06-01
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    Article

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