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    Improved Low-Frequency Noise in Recessed-Gate E-Mode AlGaN/GaN MOS-HEMTs Under Electrical and Thermal Stress

    Improved Low-Frequency Noise in Recessed-Gate E-Mode AlGaN/GaN MOS-HEMTs Under Electrical and Thermal Stress by Qianlan Hu, Chengru Gu, Dan Zhan, Xuefei Li, Yanqing Wu

    Published 2021-01-01
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