Showing 1 - 3 results of 3 for search 'Cherkassky, Alexander', query time: 0.02s Refine Results
  1. 1
    Metrology of thin silicon expitaxial films : determination of epitaxial film thickness by Fourier-transform infra-red spectrometry

    Metrology of thin silicon expitaxial films : determination of epitaxial film thickness by Fourier-transform infra-red spectrometry by Cherkassky, Alexander (Alexander Peter), 1963-

    Published 2005
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    Thesis
  2. 2
    Metrology of very thin silicon epitaxial films

    Metrology of very thin silicon epitaxial films by Cherkassky, Alexander (Alexander Peter), 1963-

    Published 2009
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    Thesis
  3. 3
    Cognitive Information Processing

    Cognitive Information Processing by Troxel, Donald E., Heytens, Michael L., Jayavant, Rajeev, Kommrusch, Steve, Monta, Peter, Kaliszewski, Joseph V., Lynn, Charles W., Picard, Leonard, Ono, Joanne, Tsakiris, Todd, Vinciguerra, Ralph, Cherkassky, Alexander

    Published 2010
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    Technical Report

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