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    Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials

    Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials by Yi-Lung Cheng, Wei-Fan Peng, Chi-Jia Huang, Giin-Shan Chen, Jau-Shiung Fang

    Published 2023-01-01
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