Spectral-Coding-Based Compressive Single-Pixel NIR Spectroscopy in the Sub-Millisecond Regime by Paul Gattinger, Ivan Zorin, Christian Rankl, Markus Brandstetter

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THz computed tomography for non-destructive testing by Peter Fosodeder, Michael Pfleger, Sandrine van Frank, Christian Rankl

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In-Mould OCT Sensors Combined with Piezo-Actuated Positioning Devices for Compensating for Displacement in Injection Overmoulding of Optoelectronic Parts by Günther Hannesschläger, Martin Schwarze, Elisabeth Leiss-Holzinger, Christian Rankl

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Terahertz Time-Domain Polarimetry in Reflection for Film Characterization by Sandrine van Frank, Elisabeth Leiss-Holzinger, Michael Pfleger, Christian Rankl

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Diffraction-limited hyperspectral mid-infrared single-pixel microscopy by Alexander Ebner, Paul Gattinger, Ivan Zorin, Lukas Krainer, Christian Rankl, Markus Brandstetter

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Quality Control of Composite parts by robot guided Terahertz imaging by Michael Pfleger, Peter Fosodeder, Harald Sehrschön, Joe Dobson, Sophie Cozien-Cazuc, Sandrine van Frank, Christian Rankl

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