Showing 1 - 15 results of 15 for search 'Chrong Jung Lin', query time: 0.07s Refine Results
  1. 1
    RTN and Annealing Related to Stress and Temperature in FIND RRAM Array

    RTN and Annealing Related to Stress and Temperature in FIND RRAM Array by Chih Yuan Chen, Chrong Jung Lin, Ya-Chin King

    Published 2019-01-01
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  2. 2
    Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes

    Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes by Chi Su, Yi-Pei Tsai, Chrong-Jung Lin, Ya-Chin King

    Published 2020-05-01
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  3. 3
    An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

    An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array by Yun-Feng Kao, Jiaw-Ren Shih, Chrong Jung Lin, Ya-Chin King

    Published 2021-07-01
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  4. 4
    Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

    Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes by Yi-Pei Tsai, Ting-Huan Hsieh, Chrong Jung Lin, Ya-Chin King

    Published 2017-11-01
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  5. 5
    A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model

    A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model by Yun-Feng Kao, Wei Cheng Zhuang, Chrong-Jung Lin, Ya-Chin King

    Published 2018-07-01
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  6. 6
    Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

    Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes by Yi-Pei Tsai, Ting-Huan Hsieh, Chrong Jung Lin, Ya-Chin King

    Published 2017-09-01
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  7. 7
    Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes

    Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes by Yi-Jie Chao, Kai-Wei Yang, Chi Su, Chrong-Jung Lin, Ya-Chin King

    Published 2021-07-01
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  8. 8
    A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process

    A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process by Meng-Yin Hsu, Chu-Feng Liao, Yi-Hong Shih, Chrong Jung Lin, Ya-Chin King

    Published 2017-06-01
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  9. 9
    Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology

    Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology by Chien-Ping Wang, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin, Ya-Chin King

    Published 2021-05-01
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  10. 10
    High-density via RRAM cell with multi-level setting by current compliance circuits

    High-density via RRAM cell with multi-level setting by current compliance circuits by Yu-Cheng Hsieh, Yu-Cheng Lin, Yao-Hung Huang, Yu-Der Chih, Jonathan Chang, Chrong-Jung Lin, Ya-Chin King

    Published 2024-03-01
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  11. 11
    On-Chip Recovery Operation for Self-Aligned Nitride Logic Non-Volatile Memory Cells in High-K Metal Gate CMOS Technology

    On-Chip Recovery Operation for Self-Aligned Nitride Logic Non-Volatile Memory Cells in High-K Metal Gate CMOS Technology by Po-Yen Lin, Yu-Lun Chiu, Yuh-Te Sung, Jim Chen, Tzong-Sheng Chang, Ya-Chin King, Chrong Jung Lin

    Published 2015-01-01
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  12. 12
    Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology

    Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology by Chien-Ping Wang, Ying-Chun Shen, Peng-Chun Liou, Yu-Lun Chueh, Yue-Der Chih, Jonathan Chang, Chrong-Jung Lin, Ya-Chin King

    Published 2019-04-01
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  13. 13
    Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology

    Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology by Chien-Ping Wang, Burn Jeng Lin, Pin-Jiun Wu, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin, Ya-Chin King

    Published 2022-01-01
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  14. 14
    Via Diode in Cu Backend Process for 3D Cross-Point RRAM Arrays

    Via Diode in Cu Backend Process for 3D Cross-Point RRAM Arrays by Yu-Cheng Liao, Hsin-Wei Pan, Min-Che Hsieh, Tzong-Sheng Chang, Yu-Der Chih, Ming-Jinn Tsai, Chrong Jung Lin, Ya-Chin King

    Published 2014-01-01
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  15. 15
    Retention Model of TaO/HfO x and TaO/AlO x RRAM with Self-Rectifying Switch Characteristics

    Retention Model of TaO/HfO x and TaO/AlO x RRAM with Self-Rectifying Switch Characteristics by Yu-De Lin, Pang-Shiu Chen, Heng-Yuan Lee, Yu-Sheng Chen, Sk. Ziaur Rahaman, Kan-Hsueh Tsai, Chien-Hua Hsu, Wei-Su Chen, Pei-Hua Wang, Ya-Chin King, Chrong Jung Lin

    Published 2017-06-01
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