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    Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC

    Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC by Chi-Jih Shih, Chih-Yao Hsu, Chun-Yi Kuo, James Li, Jiann-Chyi Rau, Krishnendu Chakrabarty

    Published 2012-01-01
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