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1

Unbalanced-Tests to the Improvement of Yield and Quality by Chung-Huang Yeh, Jwu-E Chen

Published 2021-12-01

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2

Retesting Schemes That Improve Test Quality and Yield Using a Test Guardband by Chung-Huang Yeh, Jwu-E Chen

Published 2023-12-01

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3

Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect by Chung-Huang Yeh, Jwu-E Chen

Published 2022-05-01

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4

Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield by Chung-Huang Yeh, Jwu-E Chen, Chia-Jui Chang, Tse-Chia Huang

Published 2022-03-01

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