Gaas Displacement Damage Dosimeter Based on Diode Dark Currents by Warner Jeffrey H., Messenger Scott R., Cress Cory D., Roche Nicolas J-H, Yakes Michael, Clarke Kenneth, Bennett Mitchell F., Jenkins Phillip P., Walters Robert J.

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The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs) by Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Li, Mo, Alphenaar, Bruce W, Lin, Ji-Tzuoh, Shurva, Pranoy Deb, McNamara, Shamus, Walsh, Kevin M, Feng, Philip X-L, Hutin, Louis, Ernst, Thomas, Homeijer, Brian D, Polcawich, Ronald G, Proie, Robert M, Jones, Jacob L, Glaser, Evan R, Cress, Cory D, Bassiri-Gharb, Nazanin, Du, Qingyang, Hu, Juejun

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