Showing 1 - 2 results of 2 for search 'Dózsa László', query time: 0.02s Refine Results
  1. 1
    Microscopic study of electrical properties of CrSi<sub>2 </sub>nanocrystals in silicon

    Microscopic study of electrical properties of CrSi<sub>2 </sub>nanocrystals in silicon by L&#225;nyi &#352;tefan, Galkin Nikolay, Raineri Vito, Giannazzo Filippo, D&#243;zsa L&#225;szl&#243;

    Published 2011-01-01
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  2. 2
    Scanning tip measurement for identification of point defects

    Scanning tip measurement for identification of point defects by Raineri Vito, Giannazzo Filippo, L&#225;nyi &#352;tefan, D&#243;zsa L&#225;szl&#243;, Moln&#225;r Gy&#246;rgy, Ferencz J&#225;nos

    Published 2011-01-01
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    Article

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