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    Erosion characterization of SiC and Ti3SiC2 on DIII-D using focused ion beam micro-trenches

    Erosion characterization of SiC and Ti3SiC2 on DIII-D using focused ion beam micro-trenches by J. Coburn, E. Unterberg, J. Barton, D. Rudakov, I. Bykov, C.M. Parish, R. Wilcox, C. Lasnier, T. Abrams, J. Watkins, D.L. Hillis, M. Bourham

    Published 2019-05-01
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    Article

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