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  1. 1
    Alleviating Class-Imbalance Data of Semiconductor Equipment Anomaly Detection Study

    Alleviating Class-Imbalance Data of Semiconductor Equipment Anomaly Detection Study by Da Hoon Seol, Jeong Eun Choi, Chan Young Kim, Sang Jeen Hong

    Published 2023-01-01
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    Article
  2. 2
    Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data

    Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data by Jeong Eun Choi, Da Hoon Seol, Chan Young Kim, Sang Jeen Hong

    Published 2023-02-01
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    Article

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