Challenging Point Scanning across Electron Microscopy and Optical Imaging using Computational Imaging by Akhil Kallepalli, Lorenzo Viani, Daan Stellinga, Enzo Rotunno, Richard Bowman, Graham M. Gibson, Ming-Jie Sun, Paolo Rosi, Stefano Frabboni, Roberto Balboni, Andrea Migliori, Vincenzo Grillo, Miles J. Padgett

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