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Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopy by Arno Annys, Daen Jannis, Johan Verbeeck
Published 2023-08-01
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Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope by Daen Jannis, Knut Müller-Caspary, Armand Béché, Jo Verbeeck
Published 2021-09-01
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