Dynamic quantitative phase microscopy: a single-shot approach using geometric phase interferometry by Ana Espinosa-Momox, Brandon Norton, David I. Serrano-García, Rosario Porras-Aguilar

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Total retardance measurements based on the complex Fourier coefficients for the rotating polarizer analyzer system by Geliztle A. Parra-Escamilla, Joel Cervantes-L, Jorge L. Flores, David I. Serrano-García

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Michelson interferometer for phase shifting interferometry with a liquid crystal retarder by Yanely B. Machuca-Bautista, Marija Strojnik, Jorge L. Flores, David I. Serrano-García, Guillermo García-Torales

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