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  1. 1
    Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers

    Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers by Olivier Douhéret, Didier Théron, David Moerman

    Published 2020-11-01
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  2. 2
    Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

    Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals by Yann Almadori, David Moerman, Jaume Llacer Martinez, Philippe Leclère, Benjamin Grévin

    Published 2018-06-01
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    Article

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