Hybrid statistics-simulations based method for atom-counting from ADF STEM images حسب De wael, A, De Backer, A, Jones, L, Nellist, P, Van Aert, S

Measuring dynamic structural changes of nanoparticles at the atomic scale using scanning transmission electron microscopy حسب De Wael, A, Annick, Jones, L, Varambhia, A, Nellist, PD, Van Aert, S