EBIC INVESTIGATIONS OF DISLOCATIONS AND THEIR INTERACTIONS WITH IMPURITIES IN SILICON por Fell, T, Wilshaw, P, Decoteau, M

GETTERING OF COPPER AND IRON TO EXTENDED SURFACE-DEFECTS IN SILICON por Decoteau, M, Wilshaw, P, Falster, R

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS por Decoteau, M, Wilshaw, P, Falster, R

PRECIPITATION OF IRON IN SILICON - GETTERING TO EXTENDED SURFACE DEFECT SITES por Decoteau, M, Wilshaw, P, Falster, R

GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON por Decoteau, M, Wilshaw, P, Falster, R

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS por Decoteau, M, Wilshaw, P, Falster, R

ELECTRON-BEAM-INDUCED ACTIVITY OF DEFECTS IN SILICON por Wilshaw, P, Fell, T, Amaku, C, Decoteau, M